@@ -2005,7 +2005,7 @@ static void TestPubkey_x509Extraction(nlTestSuite * inSuite, void * inContext)
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for (size_t i = 0 ; i < gNumTestCerts ; i++)
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{
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- uint8_t certType = TestCerts::gTestCerts [i];
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+ TestCert certType = TestCerts::gTestCerts [i];
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err = GetTestCert (certType, TestCertLoadFlags::kDERForm , cert);
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NL_TEST_ASSERT (inSuite, err == CHIP_NO_ERROR);
@@ -2193,7 +2193,7 @@ static void TestSKID_x509Extraction(nlTestSuite * inSuite, void * inContext)
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for (size_t i = 0 ; i < gNumTestCerts ; i++)
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{
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- uint8_t certType = gTestCerts [i];
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+ TestCert certType = gTestCerts [i];
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err = GetTestCert (certType, TestCertLoadFlags::kDERForm , cert);
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NL_TEST_ASSERT (inSuite, err == CHIP_NO_ERROR);
@@ -2220,7 +2220,7 @@ static void TestAKID_x509Extraction(nlTestSuite * inSuite, void * inContext)
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for (size_t i = 0 ; i < gNumTestCerts ; i++)
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{
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- uint8_t certType = gTestCerts [i];
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+ TestCert certType = gTestCerts [i];
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err = GetTestCert (certType, TestCertLoadFlags::kDERForm , cert);
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NL_TEST_ASSERT (inSuite, err == CHIP_NO_ERROR);
@@ -2360,7 +2360,7 @@ static void TestSerialNumber_x509Extraction(nlTestSuite * inSuite, void * inCont
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struct SerialNumberTestCase
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{
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- uint8_t Cert;
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+ TestCert Cert;
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ByteSpan mExpectedResult ;
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};
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@@ -2401,7 +2401,7 @@ static void TestSubject_x509Extraction(nlTestSuite * inSuite, void * inContext)
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struct TestCase
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{
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- uint8_t Cert;
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+ TestCert Cert;
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ChipDN mExpectedDN ;
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};
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@@ -2475,7 +2475,7 @@ static void TestIssuer_x509Extraction(nlTestSuite * inSuite, void * inContext)
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struct TestCase
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{
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- uint8_t Cert;
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+ TestCert Cert;
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ChipDN mExpectedDN ;
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};
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